- Doğa, Tıp, Bilgisayar Bilimleri, Teknoloji
- Fizik, astronomi
- Semiconductor Characterization Techniques
- Semiconductor Characterization Techniques kitap kapağı
- Kitap başlığı:
-
Semiconductor Characterization Techniques
Schottky Diode
PopulPublishing (2012-04-20 )
kupun için uygun
- ISBN-13:
978-613-8-75923-2
- ISBN-10:
- 6138759230
- EAN:
- 9786138759232
- Kitabın dili:
- Özet:
- Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc. These quantities fall into three categories when it comes to characterization methods: 1) Electrical Characterization 2) Optical Characterization 3) Physical/Chemical Characterization.
- Yayınevi:
- PopulPublishing
- Websitesi:
- http://www.betascript-publishing.com
- Düzenleyen:
- Dewayne Rocky Aloysius
- Sayfa sayısı:
- 72
- Yayın tarihi:
- 2012-04-20
- Hisse:
- Mevcut
- Kategori:
- Fizik, astronomi
- Fiyat:
- 34.00 €
- Anahtar kelimeler:
- SEMICONDUCTOR, characterization, Techniques, Method, Diode, Schottky
