Обложка Semiconductor Characterization Techniques
Название книги:

Semiconductor Characterization Techniques

Schottky Diode

PopulPublishing (2012-04-20 )

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ISBN-13:

978-613-8-75923-2

ISBN-10:
6138759230
EAN:
9786138759232
Язык Книги:
Английский
Краткое описание:
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc. These quantities fall into three categories when it comes to characterization methods: 1) Electrical Characterization 2) Optical Characterization 3) Physical/Chemical Characterization.
Издательский Дом:
PopulPublishing
Веб-сайт:
http://www.betascript-publishing.com
Edited by:
Dewayne Rocky Aloysius
Количество страниц:
72
Опубликовано:
2012-04-20
Акции:
В наличии
Категория:
Физика, астрономия
Цена:
34.00 €
Ключевые слова:
SEMICONDUCTOR, characterization, Techniques, Method, Diode, Schottky

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