Capa do livro de Semiconductor Characterization Techniques
Título do livro:

Semiconductor Characterization Techniques

Schottky Diode

PopulPublishing (2012-04-20 )

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ISBN- 1 3:

978-613-8-75923-2

ISBN- 1 0:
6138759230
EAN:
9786138759232
Idioma do livro:
Inglês
Anotações e citações/ texto breve:
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc. These quantities fall into three categories when it comes to characterization methods: 1) Electrical Characterization 2) Optical Characterization 3) Physical/Chemical Characterization.
Editora:
PopulPublishing
Website:
http://www.betascript-publishing.com
Editado por:
Dewayne Rocky Aloysius
Número de páginas:
72
Publicado em:
2012-04-20
Stock:
Disponível
Categoria:
Físicas, astronomia
Preço:
34.00 €
Palavras chave:
SEMICONDUCTOR, characterization, Techniques, Method, Diode, Schottky

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