Copertina di Semiconductor Characterization Techniques
Titolo del libro:

Semiconductor Characterization Techniques

Schottky Diode

PopulPublishing (20.04.2012 )

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ISBN-13:

978-613-8-75923-2

ISBN-10:
6138759230
EAN:
9786138759232
Lingua del libro:
Inglese
Risvolto di copertina:
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc. These quantities fall into three categories when it comes to characterization methods: 1) Electrical Characterization 2) Optical Characterization 3) Physical/Chemical Characterization.
Casa editrice:
PopulPublishing
Sito Web:
http://www.betascript-publishing.com
A cura di:
Dewayne Rocky Aloysius
Numero di pagine:
72
Pubblicato il:
20.04.2012
Giacenza di magazzino:
Disponibile
categoria:
Fisica, Astronomia
Prezzo:
34,00 €
Parole chiave:
SEMICONDUCTOR, characterization, Techniques, Method, Diode, Schottky

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