Bookcover of Two-Tone PLL
Booktitle:

Two-Tone PLL

Two-Tone PLL for On-Chip RF Test

VDM Verlag Dr. Müller (2009-07-26 )

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ISBN-13:

978-3-639-18089-3

ISBN-10:
3639180895
EAN:
9783639180893
Book language:
English
Blurb/Shorttext:
In present era VLSI ICs, production test is becomming increasingly expensive. Especially in case of mixed signal/RF chips, it can even override the direct manufacturing expenses.Under this context built inself test(BiST)can be viable solution to overcome this problem, which so far not appreciated by chip industry.In this book the two tone PLL provides solution and this circuit is intende for on-chip test of RF blocks. The primary application is the third order intermodulation test(TOI), vital for RF front end. If the spectral analysis can also be completed by DSP available on the chip or on board it provides a built -in- selftest(BiST), which can replace costly test instrumentation(ATE). The advantage of the designed two-tone PLL is that it practically prevents the locking effect, while keeping the two oscillation frequencyies close. The two-tone PLL has been designed and verified at the system level using verilog-A models in CadenceTM. Besides,two building blocks of the PLL were implemented at the circuit level in 90 nm CMOS technology.And this book is useful for professionals in the field of mixed-signal/RF IC.
Publishing house:
VDM Verlag Dr. Müller
Website:
http://www.vdm-verlag.de
By (author) :
Muhammad Shuaib
Number of pages:
80
Published on:
2009-07-26
Stock:
Available
Category:
Electronics, electro-technology, communications technology
Price:
49.00 €
Keywords:
"Phased lock loop, Two-Tone Test, BiST, Amplitude Modulation, IP3, Architecure of Two-Tone PLL, Tunable VCO, Non-Linear block, RFIC hierarchy, Systeml-evel-Design", Architecure of Two-Tone PLL

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