Bookcover of Statistical Modeling and Simulation for VLSI Circuits and Systems
Booktitle:

Statistical Modeling and Simulation for VLSI Circuits and Systems

Study on Uncertainty of Integrated Circuits

VDM Verlag Dr. Müller (2011-04-05 )

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ISBN-13:

978-3-639-34629-9

ISBN-10:
3639346297
EAN:
9783639346299
Book language:
English
Blurb/Shorttext:
With the continuous technology advance, the feature size of nowadays integrated circuits (IC) has entered the nanometer era, which introduces many significant challenges for IC designs. This book provides an overview of these issues and further develops some potential solutions to address these important topics. The contents of this book are based upon several previous publications, which were published in top-ranked international conferences, mainly from IEEE/ACM Design Automation Conference. This book clearly describes the sources of inevitable uncertainties observed from manufactured VLSI circuits and systems, and presents substantial insights into emerging challenges for IC designs and manufacturing. Moreover, this book proposes several novel algorithms to cope with these issues, including uncertainty extraction, stochastic circuit behavior modeling and parametric yield estimation. Enriched with comprehensive illustration and extensive experiments, it is useful to IC designers and researchers who are interested with nanometer IC designs.
Publishing house:
VDM Verlag Dr. Müller
Website:
http://www.vdm-verlag.de
By (author) :
Fang Gong
Number of pages:
64
Published on:
2011-04-05
Stock:
Available
Category:
Electronics, electro-technology, communications technology
Price:
49.00 €
Keywords:
Electronic Integrated Circuits, Stochastic Modeling, Circuit Simulation, Process Variation, Device Noise.

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