Bookcover of Reliability Prediction by Accelerated Life Testing
Booktitle:

Reliability Prediction by Accelerated Life Testing

Methodology & Planning

LAP LAMBERT Academic Publishing (2015-06-16 )

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ISBN-13:

978-3-659-69349-6

ISBN-10:
3659693499
EAN:
9783659693496
Book language:
English
Blurb/Shorttext:
Over the past few decades, reliability has grown to become an important design attribute of critical electronic systems. Reliability is embedded into systems during design phase itself and improved by means of failure analysis & testing. However, it is important to verify the reliability of a critical system before it is deployed. The three well-known methods for reliability prediction are empirical method, physics of failure and life testing. Accelerated life testing, on the other hand is an extension of life testing method where the units under test are subjected to elevated stress levels to induce early failures. The test depends on accelerating the dominant failure mechanisms which reduce the time of testing. The book focuses on reliability prediction of electronic modules by means of accelerated life testing. Step by step planning of the test is the highlight of this book.
Publishing house:
LAP LAMBERT Academic Publishing
Website:
https://www.lap-publishing.com/
By (author) :
Diana Denice, Manoj Kumar, Prashant P. Marathe
Number of pages:
60
Published on:
2015-06-16
Stock:
Available
Category:
Electronics, electro-technology, communications technology
Price:
39.90 €
Keywords:
Failure Mechanisms, Reliability Prediction, life test, accelerated life test, physics of failure, Reliability

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