Bookcover of High Performance GaN Light-Emitting Diode
Booktitle:

High Performance GaN Light-Emitting Diode

A Reliability Study

LAP LAMBERT Academic Publishing (2011-05-20 )

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ISBN-13:

978-3-8443-9529-7

ISBN-10:
3844395296
EAN:
9783844395297
Book language:
English
Blurb/Shorttext:
The reliability of InGaN/GaN light emitting diodes (LEDs) with different emission wavelengths and different geometries was studied. Device performances, like current-voltage characteristics, 1/f noise spectrum, leakage, static resistance, were measured. The devices underwent a 1000-hr constant-current stress test and their optical output degradation rate was examined. The results were explained by cross-related data.
Publishing house:
LAP LAMBERT Academic Publishing
Website:
https://www.lap-publishing.com/
By (author) :
ZONGLIN LI
Number of pages:
80
Published on:
2011-05-20
Stock:
Available
Category:
Electronics, electro-technology, communications technology
Price:
49.00 €
Keywords:
Gallium Nitride, Light Emitting Diode, Reliability, High Performance, Light-emitting diode, reliability

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