Couverture de Semiconductor Characterization Techniques
Titre du livre:

Semiconductor Characterization Techniques

Schottky Diode

PopulPublishing (20-04-2012 )

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ISBN-13:

978-613-8-75923-2

ISBN-10:
6138759230
EAN:
9786138759232
Langue du livre:
Anglais
texte du rabat:
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc. These quantities fall into three categories when it comes to characterization methods: 1) Electrical Characterization 2) Optical Characterization 3) Physical/Chemical Characterization.
Maison d'édition:
PopulPublishing
Site Web:
http://www.betascript-publishing.com
Edité par:
Dewayne Rocky Aloysius
Numéro de pages:
72
Publié le:
20-04-2012
Stock:
Disponible
Catégorie:
Physique, Astronomie
Prix:
34.00 €
Mots-clés:
SEMICONDUCTOR, characterization, Techniques, Method, Diode, Schottky

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