Portada del libro de Semiconductor Characterization Techniques
Título del libro:

Semiconductor Characterization Techniques

Schottky Diode

PopulPublishing (2012-04-20 )

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ISBN-13:

978-613-8-75923-2

ISBN-10:
6138759230
EAN:
9786138759232
Idioma del libro:
Inglés
Notas y citas / Texto breve:
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc. These quantities fall into three categories when it comes to characterization methods: 1) Electrical Characterization 2) Optical Characterization 3) Physical/Chemical Characterization.
Editorial:
PopulPublishing
Sitio web:
http://www.betascript-publishing.com
Editado por:
Dewayne Rocky Aloysius
Número de páginas:
72
Publicado en:
2012-04-20
Stock:
Disponible
Categoría:
La física, la astronomía
Precio:
34.00 €
Palabras clave:
SEMICONDUCTOR, characterization, Techniques, Method, Diode, Schottky

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