Buchcover von Semiconductor Characterization Techniques
Buchtitel:

Semiconductor Characterization Techniques

Schottky Diode

PopulPublishing (20.04.2012 )

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ISBN-13:

978-613-8-75923-2

ISBN-10:
6138759230
EAN:
9786138759232
Buchsprache:
Englisch
Klappentext:
Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc. These quantities fall into three categories when it comes to characterization methods: 1) Electrical Characterization 2) Optical Characterization 3) Physical/Chemical Characterization.
Verlag:
PopulPublishing
Webseite:
http://www.betascript-publishing.com
Herausgegeben von:
Dewayne Rocky Aloysius
Seitenanzahl:
72
Veröffentlicht am:
20.04.2012
Lagerbestand:
Lieferbar
Kategorie:
Physik, Astronomie
Preis:
34,00 €
Stichworte:
SEMICONDUCTOR, characterization, Techniques, Method, Diode, Schottky

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